TM 11-6625-2398-15-3
CHAPTER 6
GENERAL SUPPORT MAINTENANCE
Section I. GENERAL TROUBLESHOOTING INFORMATION
(1) Visual inspection. The purpose of visual
inspection is to locate faults without testing or
WARNING
measuring.
When using this equipment in
(2) Operational. Except for the hybrid attenuator
conjunction with the iff set, be
assembly, troubleshooting is based on the operational
extremely careful because of high
use of this equipment with an iff set.
voltages associated with some
assemblies of the IFF set. Consult
c.
Localization.
In the course of using this
the applicable IFF set TM for further
equipment to maintain the iff set, the operational or
information on circuits that are
maintenance tests called for in the iff set manual may
extremely dangerous.
be used in determining the location of the fault in the
test facilities set (para 6-5).
6-1. General Instructions
d. Procedures for isolating troubles in the hybrid
Troubleshooting at general support (GS) maintenance
attenuator assembly are given in paragraph 66.
level includes all the techniques outlined for operator's
and organizational maintenance, and any special or
e. Techniques. In performing the sectionalization,
additional techniques required to isolate a defective
localization, and isolation procedures, the following
part. Section II provides troubleshooting procedures to
techniques may be applied:
be used at the GS level.
Section III provides
component testing and calibration techniques.
(1) Insulation resistance measurements.
6-2. Organization of Troubleshooting Procedures
(2) Continuity checks.
a. General. The three steps in servicing the test
6-3. Test Equipment Required
facilities set are:
The following chart lists test equipment required for
(1) Sectionalization of the fault
troubleshooting the test facilities set. The associated
technical manuals are also listed.
(2) Localization of the fault
CAUTION
(3) Isolation of the fault
Be certain that the components of test
facilities set are disconnected from the IFF set
b. Sectionalization. The test facilities set consists of
before performing troubleshooting. The IFF
the components listed in paragraph 1-6. The first step in
set contains transistors which could be
tracing the trouble is to locate the component or
damaged.
components at fault by the following methods:
6-1
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